BERT - CIRCUIT AGING SIMULATOR (CAS)

Authors:
Lee, Peter M.
Kuo, Mary M.
Ko, Ping K.
Hu, Chenrning
Technical Report Identifier: ERL-90-2
January 1990

Abstract: A Circuit Aging Simulator (CAS) has been developed as part of the Berkeley Reliability Tools (BERT) to predict the effects of hot-electron degradation on circuit behavior. Using the SPICE2 or SPICE3 circuit simulator, CAS simulates circuit behavior at a user-specified future time point using fresh and pre-stressed model parameter files. CAS is configured in a pre- and post-processor configuration so that no modifications to the SPICE code is necessary. An accompanying UNIX shell script has been developed for user-friendliness and automation so that iterative simulation can easily be done to take into account the effects of on-going degradation.