University of California, Berkeley
EECS Technical Reports
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Terms: 1990
Results: 92 item(s)
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Title:   Human Factors Evaluation of a Textual, Graphical, and Natural Language Query Interfaces 100
  Author(s):   Bell, John E.    Rowe, Lawrence A.      
  Report ID:   ERL-90-12  

Title:   Improving Software Fault Tolerance in Highly Available Database Systems 100
  Author(s):   Sullivan, Mark    Stonebraker, Michael      
  Report ID:   ERL-90-11  

Title:   Theory of a Helical Resonator Plasma Source 100
  Author(s):   Lieberman, M.A.    Lichtenberg, A.J.    Flamm, D.L.      
  Report ID:   ERL-90-10  

Title:   An Elementary Proof of the Routh-Hurwitz Stability Criterion 100
  Author(s):   Anagnost, J.J.    Desoer, C.A.      
  Report ID:   ERL-90-9  

Title:   Special issues in semiconductor manufacturing : EECS 290W class project reports, Fall 1989 100
  Author(s):   Spanos, Costas J.    Boskin, E.D.    Fong, Y.K.    Garfinkel, T.    Guo, H.    Hegarty, C.J.    Hu, T.H.    Lee, S.F.    Luan, T.L.    May, G.S.    Ramirez, J.    Rosenbaum, E      
  Report ID:   ERL-90-8  

Title:   A Tool for Collection of I-V Statistics Using the HP 4062 Semiconductor Parametric 100
  Author(s):   Ni, Chia-Ray      
  Report ID:   ERL-90-7  

Title:   Bivariate Time Series Analysis of Simulated Annealing Data 100
  Author(s):   Sorkin, Gregory      
  Report ID:   ERL-90-6  

Title:   Univariate Time Series Analysis of Simulated Annealing Data 100
  Author(s):   Sorkin, Gregory      
  Report ID:   ERL-90-5  

Title:   BERT- Circuit Oxide Reliability Simulator (CORS) 100
  Author(s):   Rosenbaum, Elyse    Lee, Peter M.    Moazzami, Reza    Ko, P.K.    Hu, C.      
  Report ID:   ERL-90-4  

Title:   BERT--Circuit Electromigration Simulator 100
  Author(s):   Liew, B.K.    Fang, P.    Hu, C.      
  Report ID:   ERL-90-3  

  Author(s):   Lee, Peter M.    Kuo, Mary M.    Ko, Ping K.    Hu, Chenrning      
  Report ID:   ERL-90-2  

  Author(s):   Wong, Eugene      
  Report ID:   ERL-90-1  

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